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Atomic Structure and Properties of Charged Domain Walls in BiFeO3 Films

Published online by Cambridge University Press:  09 October 2013

L. Li ,
P. Gao ,
C. Nelson ,
Y. Zhang ,
S.-J. Kim ,
A. Melville ,
C. Adamo ,
D. Schlom  and
X. Pan
L. Li
Affiliation:
P. Gao
Affiliation:
C. Nelson
Affiliation:
Y. Zhang
Affiliation:
S.-J. Kim
Affiliation:
A. Melville
Affiliation:
C. Adamo
Affiliation:
D. Schlom
Affiliation:
X. Pan
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1654 - 1655
Copyright
Copyright © Microscopy Society of America 2013