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Atomic Scale Grain Boundary Analysis by Incoherent Imaging With TEM/STEM

Published online by Cambridge University Press:  02 July 2020

M. Kawasaki ,
T. Yamazaki ,
K. Watanabe  and
M. Shiojiri
M. Kawasaki
Affiliation:
JEOL ltd., Tokyo, 196-8558Japan
T. Yamazaki
Affiliation:
T, okyo Science University, Tokyo, 162-8601Japan
K. Watanabe
Affiliation:
Tokyo Metropolitan College of Technology, Tokyo, 140-0011Japan
M. Shiojiri
Affiliation:
Kanazawa Medical University, Ishikawa, 920-0293Japan
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Extract

Quantitative compositional characterization was carried out on a ceramic boundary using atomic resolution high-angle annular dark field scanning transmission electron microscopy (HAADFSTEM), with the aid of HAADF image simulation. HAADF-STEM observation was performed with a JEM-2010F TEM/STEM equipped with a field emission gun and an HAADF detector. And also the image simulation for HAADF was made on a computer by the program that was developed by the authors using Bethe's method.

The material used in this experiment that was provided by TDK Co., is a semiconducting SrTiO3 (STO) ceramic condenser. The bulk substance was formed by the process of sintering in a reduced ambience followed by the reoxidization in the air after surface coating with Bi2O3, PbO and CuO compounds resulting in having a unique structure with Bi diffusion layers at the grain boundary region.

Type
The Theory and Practice of Scanning Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 124 - 125
Copyright
Copyright © Microscopy Society of America

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References

1)Kawasaki, M. et al.: J. Electron Microsc. 49, in printingGoogle Scholar
2)Crewe, A.V. et al: Science, 168 (1970) 1338CrossRefGoogle Scholar