Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-23T06:42:12.210Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Resolution Electron Tomography on a Discrete Grid: Atom Count Errors

Published online by Cambridge University Press:  01 August 2005

K J Batenburg ,
J R Jinschek  and
C F Kisielowski
K J Batenburg
Affiliation:
Leiden University
J R Jinschek
Affiliation:
Lawrence Berkeley National Laboratory
C F Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2120 - 2121
Copyright
© 2005 Microscopy Society of America