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Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM

Published online by Cambridge University Press:  27 August 2014

G. Yang ,
G. Hu ,
S. Cheng  and
T. Wagberg
G. Yang
Affiliation:
Electronic Materials Research Laboratory, Key Laboratory of The Ministry of Education& International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an, China
G. Hu
Affiliation:
Department of Physics, Umea University, Umea, Sweden
S. Cheng
Affiliation:
Electronic Materials Research Laboratory, Key Laboratory of The Ministry of Education& International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an, China
T. Wagberg
Affiliation:
Department of Physics, Umea University, Umea, Sweden

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 536 - 537
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Steele, B. et al., Nature, 414 (2001) 345.Google Scholar
[2] Peng, Z. et al., Science, 337(3012) 56.Google Scholar
[3] Zhao, et al., J. App. Phys. 108 (2010) 063704.Google Scholar
[4] The authors acknowledge the funding from National Natural Science Foundation of China (51202180), the Fundamental Research Funds for the Central Universities in China and the Swedish Research Council (2010-3973).Google Scholar