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Atomic Resolution Characterization of Ni base Nanoparticles for Energy Devices.

Published online by Cambridge University Press:  27 August 2014

H. A. Calderon ,
F. Godinez-Salomon ,
O. Solorza-Feria ,
P. Specht  and
C. Kisielowski
H. A. Calderon
Affiliation:
Dept. Física, ESFM-IPN, Zacatenco D.F. 07338, Mexico
F. Godinez-Salomon
Affiliation:
Dept. Química, CINVESTAV, Mexico D.F.Mexico
O. Solorza-Feria
Affiliation:
Dept. Química, CINVESTAV, Mexico D.F.Mexico
P. Specht
Affiliation:
JCAP and NCEM, LBNL, Berkeley, CA 94720, U.S.A.
C. Kisielowski
Affiliation:
Dept. Mats. Sci. Eng., UCB, Berkeley, CA 94720

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1138 - 1139
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Godinez Salomon, F., et al., ongoing research.Google Scholar
[2] Calderon, H. A., et al, publication in preparation.Google Scholar
[3] HACB and OSE whish to acknowledge support from CONACYT and IPN.Google Scholar