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Atomic Force Microscopy and Near-Field Scanning Optical Microscopy Study of Quantum-Dot Assemblies and Fractal Films

Published online by Cambridge University Press:  02 July 2020

W. D. Bragg ,
K. Banerjee ,
M. J. Campin ,
Z. C. Ying ,
Jane G. Zhu ,
J. E. Martin  and
J. P. Wilcoxon
W. D. Bragg
Affiliation:
Department of Physics, New Mexico State University, Las Cruces, New Mexico88003
K. Banerjee
Affiliation:
Department of Physics, New Mexico State University, Las Cruces, New Mexico88003
M. J. Campin
Affiliation:
Department of Physics, New Mexico State University, Las Cruces, New Mexico88003
Z. C. Ying
Affiliation:
Department of Physics, New Mexico State University, Las Cruces, New Mexico88003
Jane G. Zhu
Affiliation:
Department of Physics, New Mexico State University, Las Cruces, New Mexico88003
J. E. Martin
Affiliation:
Sandia National Laboratory, Albuquerque, New Mexico87108
J. P. Wilcoxon
Affiliation:
Sandia National Laboratory, Albuquerque, New Mexico87108
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Extract

Quantum dots and nanocrystalline films are interesting materials due to their novel properties, not achievable from the bulk materials [1]. New materials fabricated by assembling of quantum dots and nanostructured materials exhibit, for example, high optical nonlinearities. Fractal structures [2] can be formed from quantum-dot aggregates or films. Scanning probe microscopy is the essential technique to characterize these nanometer-scaled materials?

Gold nanocluster colloids are synthesized in the interior of surfactant aggregates known as inverse micelles, without the use of water to solubilize the metal salt [3]. The size of the Au quantum dots is well controlled in the colloid synthesis and selected using chromatography. The Au clusters are then sprayed onto a glass slides to form thin films made of Au quantum dots. We have also used the laser ablation technique [4] to grow Ag nanoparticles, fractal aggregates and thin films. These samples have been studied using atomic force microscopy (AFM) and nearfield scanning optical microscopy.

Type
Scanned Probe Microscopy: Much More Than Just Beautiful Images
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 968 - 969
Copyright
Copyright © Microscopy Society of America

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References

1. Nanostructured Materials, edited by Shalaev, V. M. and Moskovits, M., ACS Symposium series 679, (American Chemical Society, Washington, DC, 1997).Google Scholar
2.Fractal Growth Phenomena, Vicsek, T., (World Scientific, Singapore, 1992).CrossRefGoogle Scholar
3.Wilcoxon, J. P., Williamson, R. L., and Baughman, R., J. Chem. Phys. 98 (1993) 9933.CrossRefGoogle Scholar
4.Plekhanov, A. I., Plotnikov, G. L., and Safonov, V. P., Opt. Spectrosc. (USSR) 71 (1991) 451.Google Scholar
5.Bragg, W. D., Safonov, V. P., Kim, W., Banerjee, K., Young, M. R., Zhu, J. G., Ying, Z. C., Armstrong, R.L., and Shalaev, V. M., J. Microscopy (1999, in press)Google Scholar
6. The authors would like to acknowledge the support from the Sandia University Research Program at Sandia National Laboratories and New Mexico Universities Collaborative Research Program at Los Alamos National Laboratory.Google Scholar