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Atomic Electron Tomography: Past, Present and Future

Published online by Cambridge University Press:  30 July 2020

Jianwei Miao ,
Xuezeng Tian ,
Dennis Kim ,
Jihan Zhou ,
Yongsoo Yang ,
Yao Yang ,
Yakun Yuan ,
Colin Ophus ,
Andreas Schmid  and
Shize Yang
...Show all authors
Jianwei Miao
Affiliation:
University of California Los Angeles, Los Angeles, California, United States
Xuezeng Tian
Affiliation:
University of California Los Angeles, Los Angeles, California, United States
Dennis Kim
Affiliation:
University of California Los Angeles, Los Angeles, California, United States
Jihan Zhou
Affiliation:
University of California Los Angeles, Los Angeles, California, United States
Yongsoo Yang
Affiliation:
University of California Los Angeles, Los Angeles, California, United States
Yao Yang
Affiliation:
University of California Los Angeles, Los Angeles, California, United States
Yakun Yuan
Affiliation:
University of California Los Angeles, Los Angeles, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Andreas Schmid
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Shize Yang
Affiliation:
Arizona State University, Tempe, Arizona, United States
Fan Sun
Affiliation:
University at Buffalo, Buffalo, New York, United States
Christopher Ciccarino
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Blake Duschatko
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Juan-Carlos Idrobo
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States,
Prineha Narang
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Hao Zeng
Affiliation:
University at Buffalo, Buffalo, New York, United States
Peter Ercius
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 652 - 654
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Copyright
Copyright © Microscopy Society of America 2020

References

Miao, P. Ercius and Billinge, S. J. L., Science 353, aaf2157 (2016).10.1126/science.aaf8533CrossRefGoogle Scholar
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This work was supported by STROBE: A National Science Foundation Science & Technology Center under Grant No. DMR 1548924, the Office of Basic Energy Sciences of the U.S. DOE (Grant No. DE-SC0010378) and the NSF DMREF program (DMR-1437263). ADF-STEM imaging was performed at the Molecular Foundry, which is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. DOE under Contract No. DE-AC02—05CH11231. Part of this research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility.Google Scholar