Hostname: page-component-7479d7b7d-jwnkl Total loading time: 0 Render date: 2024-07-10T16:24:19.611Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of Low Voltage Field Emission Scanning Electron Microscopy (FE-SEM) for Characterization of Polyethersulfone/ Polyvinylpyrillidone (PES/PVP) Based Materials for Membrane Separations

Published online by Cambridge University Press:  27 August 2014

Pooja Bajaj ,
Albin Berzinis ,
Rachel Giessert  and
Carl Strom
Pooja Bajaj
Affiliation:
Sabic, 1 Noryl Avenue, Selkirk, New York 12158 USA
Albin Berzinis
Affiliation:
Sabic, 1 Noryl Avenue, Selkirk, New York 12158 USA
Rachel Giessert
Affiliation:
Sabic, 1 Noryl Avenue, Selkirk, New York 12158 USA
Carl Strom
Affiliation:
Sabic, 1 Noryl Avenue, Selkirk, New York 12158 USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2100 - 2101
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Gambro, L., et al.. (2013),PCT/EP2013/054263 WO2013/131848A1.Google Scholar
[2] Liu, J. Chem. Phys. Chem. 5 (2004), p 1084.Google Scholar
[3] Joy, D. C.and Joy, C. S. Micron 27 (1996) p 247.Google Scholar
[4] Joy, D. C. (1995) Monte Carlo Modeling for Electron Microscopy and Microanalysis, OxfordUniversity Press, New York, NY.Google Scholar
[5] Chen, Z., et al.. (2010),Ind. Eng. Chem. Res. 49.Google Scholar