Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-24T11:27:25.154Z Has data issue: false hasContentIssue false

Applications of 2D/3D TOF-SIMS with Fast MS/MS Imaging and keV-CID Identification for Research and Industrial Problem Solving: Low-abundance Molecules, Stereoisomers, Monolayers & Devices

Published online by Cambridge University Press:  30 July 2020

Gregory Fisher*
Affiliation:
Physical Electronics, Chanhassen, Minnesota, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Applications of Secondary Ion Mass Spectrometry to Organic and Material Systems
Copyright
Copyright © Microscopy Society of America 2020

References

(a) Fisher, G.L., et al. , Anal. Chem. 88 (2016) 6433. (b) G.L. Fisher, et al, Microscop. Microanal. 23 (2017) 843. (c) C.E. Chini, et al, Biointerphases 13 (2018) 03B409. (d) T. Fu, et al, Nature Sci. Rep. 9 (2018) 1928.10.1021/acs.analchem.6b01022CrossRefGoogle Scholar