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Application of Orientation Imaging Microscopy in the TEM to studies of nano-crystalline materials

Published online by Cambridge University Press:  01 August 2002

D. J. Dingley
Affiliation:
TSL/EDAX, 392 E. 12300S. Draper, UT 40057
M. J. Tiner
Affiliation:
TSL/EDAX, 392 E. 12300S. Draper, UT 40057
S. I. Wright
Affiliation:
TSL/EDAX, 392 E. 12300S. Draper, UT 40057

Abstract

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Abstract
Copyright
Copyright © Microscopy Society of America 2002