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Application of Monte Carlo Calculations to Improve Quantitative Electron Probe Microanalysis

Published online by Cambridge University Press:  27 August 2014

Xavier Llovet ,
Philippe T. Pinard  and
Francesc Salvat
Xavier Llovet
Affiliation:
CCiTUB, Universitat de Barcelona. Lluís Solé i Sabarís, 1-3. 08028 Barcelona. Spain
Philippe T. Pinard
Affiliation:
Central Facility for Electron Microscopy, RWTH Aachen, 52074 Aachen. Germany
Francesc Salvat
Affiliation:
Facultat de Física (ECM), Universitat de Barcelona. Diagonal 647. 08028 Barcelona. Spain

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 708 - 709
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Llovet, X., et al., NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Positron Impact, Version 1.0, NIST, Gaithersburg, Maryland (2014).Google Scholar
[2] Bote, D. and Salvat, F. Phys. Rev. A 77 (2008) 042701.Google Scholar
[3] Llovet, X., et al., J. Phys. Chem. Ref. Data 43 (2013). 013102.Google Scholar
[4] Llovet, X., et al., Surf. Interf. Anal 37 (2005) 1054.Google Scholar
[5] Salvat, F. PENELOPE - A code system for Monte Carlo Simulation of Electron and Photon Transport, OECD/Nuclear Energy Agency, Issy-les-Moulineaux (2013).Google Scholar
[6] Merlet, C. and Llovet, X. X-Ray Spectrom. 40 (2011). 47.Google Scholar
[7] Llovet, X., et al., J. Phys. D: Appl. Phys. 45 (2012) 225301.Google Scholar
[8] Gopon, P., et al., Micros. Microanal. 19 (2013) 1698.Google Scholar