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Application of Electron Backscatter Diffraction Techniques to Quenched and Partitioned Steels

Published online by Cambridge University Press:  31 January 2011

Grant Thomas*
Affiliation:
Department of Metallurgical and Materials Engineering, Colorado School of Mines, Advanced Steel Products and Processing Research Center, Hill Hall, Golden, CO 80401, USA
John Speer
Affiliation:
Department of Metallurgical and Materials Engineering, Colorado School of Mines, Advanced Steel Products and Processing Research Center, Hill Hall, Golden, CO 80401, USA
David Matlock
Affiliation:
Department of Metallurgical and Materials Engineering, Colorado School of Mines, Advanced Steel Products and Processing Research Center, Hill Hall, Golden, CO 80401, USA
Joseph Michael
Affiliation:
Materials Characterization Department, Sandia National Laboratories, P.O. Box 5800 MS 0886, Albuquerque, NM 87185, USA
*
Corresponding author. E-mail: gthomas@mines.edu
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Abstract

Electron backscatter diffraction (EBSD) techniques were used to characterize “hot-rolled” quenched and partitioned microstructures produced via Gleeble thermal simulations representing a hot-strip cooling practice for steel. In particular, EBSD was utilized to positively identify the morphology and location of retained austenite, to qualitatively distinguish martensite from ferrite, and in an attempt to identify transition carbides. Large pools of retained austenite and some thin films were accurately indexed; however, there was some disparity between austenite volume fractions measured by EBSD and those measured by X-ray diffraction. Due to similarities between the crystal structures of martensite and ferrite (body centered tetragonal versus body centered cubic, respectively), martensite could not be distinguished from ferrite by indexing of diffraction patterns; however, martensite could qualitatively be distinguished from ferrite by regions of low image quality based on the very high dislocation density of martensite.

Type
Electron Backscatter Diffraction Special Section
Copyright
Copyright © Microscopy Society of America 2011

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References

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