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Application of Combined Mean Atomic Number Backgrounds and Blank Corrections to EPMA Trace Element Measurements: Successes and Challenges

Published online by Cambridge University Press:  05 August 2019

Owen K. Neill ,
Nikita L. La Cruz ,
David Hernández Uribe ,
Jameson S. R. Jolles ,
Joseph R. Boro  and
John J. Donovan
Owen K. Neill*
Affiliation:
School of Earth and Environmental Sciences, University of Michigan, Ann Arbor, MI, USA.
Nikita L. La Cruz
Affiliation:
School of Earth and Environmental Sciences, University of Michigan, Ann Arbor, MI, USA.
David Hernández Uribe
Affiliation:
Department of Geology and Geological Engineering, Colorado School of Mines, Golden, CO, USA.
Jameson S. R. Jolles
Affiliation:
School of Earth and Environmental Sciences, University of Michigan, Ann Arbor, MI, USA.
Joseph R. Boro
Affiliation:
School of the Environment, Washington State University, Pullman, WA, USA
John J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR, USA.
*
*Corresponding author: okneill@umich.edu

Abstract

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Type
Advances in Characterization of Geological and Extraterrestrial Samples
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2478 - 2479
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Donovan, JJ, Singer, JW and Armstrong, JT, Am Mineral 101 (2016), p. 1839-1853.Google Scholar
[2]Donovan, JJ and Tingle, TN, J Microsc Microanal, 8 (1996), p. 1-7.Google Scholar
[3]Kramers, HA, Phil Mag, 46 (1923), p. 836.Google Scholar
[4]Donovan, JJ, Lowers, HA and Rusk, BG, Am Mineral 96(2-3) (2011), p. 274-282.Google Scholar