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Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra

Published online by Cambridge University Press:  23 September 2015

F. Eggert ,
P.P. Camus ,
A. Sandborg  and
N.J. Zaluzec
F. Eggert
Affiliation:
EDAX Inc., Ametek Materials Analysis Division, 91 McKee Drive, Mahwah, NJ, US-07430
P.P. Camus
Affiliation:
EDAX Inc., Ametek Materials Analysis Division, 91 McKee Drive, Mahwah, NJ, US-07430
A. Sandborg
Affiliation:
EDAX Inc., Ametek Materials Analysis Division, 91 McKee Drive, Mahwah, NJ, US-07430
N.J. Zaluzec
Affiliation:
Electron Microscopy Center, NST Div, Argonne National Laboratory, Argonne IL, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 825 - 826
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Eggert, F., IOP Conf. Ser.: Mater. Sci. Eng (2010) 012007.Google Scholar
[2] Lifshin, L, Ottawa. Proc.9.Ann.Conf.Microbeam Analysis Soc (1974) 53.Google Scholar
[3] Eggert, F, Experim.Techn.d.Physik 33 (1985) 441.Google Scholar
[4] EDAX Technical Note, 2014 June.Google Scholar
[5] Research supported in part by the U.S. DoE, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357 at the Electron Microscopy Center, NST Division of Argonne National Laboratory.Google Scholar