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Anomalous Beam Effects during in situ Transmission Electron Microscopy Deformation of Nanocrystalline and Ultrafine-grained Metals

Published online by Cambridge University Press:  25 July 2016

Rohit Sarkar ,
Christian Rentenberger  and
Jagannathan Rajagopalan
Rohit Sarkar
Affiliation:
School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287, USA
Christian Rentenberger
Affiliation:
Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria
Jagannathan Rajagopalan
Affiliation:
School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1498 - 1499
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Williams, D.B. & Carter, C.B. The Transmission Electron Microscope, in: Transmission Electron Microscopy, Springer US, 2009: pp. 3–22. http://link.springer.com/chapter/10.1007/978-0-387-76501-3_1 (accessed March 25, 2015).Google Scholar
[2] Zheng, K., et al, Nat Commun 1 (2010). p. 24. doi:10.1038/ncomms1021.Google Scholar
[3] Sarkar, R., Rentenberger, C. & Rajagopalan, J. Sci Rep 5 (2015) doi:10.1038/srep16345.Google Scholar
[4] This project was funded by the National Science Foundation (NSF) grants ECCS 1102201, CMMI 1400505 and DMR 1454109. The authors would like to gratefully acknowledge the use of facilities at the John M. Cowley Centre for High Resolution Electron Microscopy and the Centre for Solid State Electronics Research at Arizona State University and at the Faculty of Physics of the University of Vienna. Financial support from the Austrian Science Fund (FWF): [P22440, I1309] is acknowledged.Google Scholar