Hostname: page-component-84b7d79bbc-c654p Total loading time: 0 Render date: 2024-07-27T17:17:08.402Z Has data issue: false hasContentIssue false

Anaysis of Lacbed Patterns from A Microtwin in Cobalt

Published online by Cambridge University Press:  02 July 2020

Hwang Su Kim
Affiliation:
Department of Physics, Kyungsung University, Pusan, 608-736, Korea
Byung Ryang Ahn
Affiliation:
RIST, Advanced Analytical Research Team, Pohang, 790-330, Korea
Get access

Abstract

Recently LACBED (Large Angle Convergent Beam Electron Diffraction) studies for identifying the nature of stacking faults has been reported in [1,2]. Here we report the LACBED study for a microtwin whose images are usually similar to those of an intrinsic or an extrinsic stacking faults (for this discussion, see [3]).

Observations: Thin foils of cobalt with the thickness of about 180 nm (f.c.c phase, a=0.354 nm) were examined by a Philips CM200. Fig. 1 shows strong beam dark field images of microtwins or stacking faults. Fig. 2 shows the bright field LACBED pattern taken near the area marked as a circle in fig. 1. The specimen height, from the convergent point of beams, was about 0.0586 mm and the convergent angle was 0.615 degrees.

Calculations and analysis: Analysis of fig. 1 alone indicates the encircled fault an extrinsic stacking fault.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Tanaka, M., Terauchi, M. and Tsuda, K., Convergent Beam Electron Diffraction III, JEOL Ltd., (1994)156177.Google Scholar

2. Wei, X., Duan, X. and Wang, S., Ultramicroscopy 66 (1996) 4957.CrossRefGoogle Scholar

3. H. S.Kim, and Sheinin, S. S., phys. stat. sol. (a) 161 (1997) 335342.3.0.CO;2-X>CrossRefGoogle Scholar

4. Kim, H.S. et al, Ultramicroscopy 77 (1999) 8395CrossRefGoogle Scholar

5. This research was supported by kyungsung University research grant in 1999.Google Scholar