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Analysis on Determination of Correct Solutions in Orientation Imaging Microscopy
Published online by Cambridge University Press: 28 April 2020
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 26 , Supplement S1: Proceedings of 15th Interamerican Microscopy Congress CIASEM - SAMIC , March 2020 , pp. 15 - 16
- Copyright
- Copyright © Microscopy Society of America 2020
References
References:
[1]Schwartz, A.J., Kumar, M., Adams, B.L., Field, D.P., Electron Backscatter Diffraction in Materials Science, 2nd ed.Kluwer Academic-Plenum Publishers, New York (2000).10.1007/978-1-4757-3205-4CrossRefGoogle Scholar
[4]The authors acknowledge the Fulbright commission.Google Scholar