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Analysis of Stresses and Strains around Dislocations at Grain Boundaries by Quantitative High-Resolution Electron Microscopy

Published online by Cambridge University Press:  31 July 2006

M Hytch ,
J-L Putaux  and
J Thibault
M Hytch
Affiliation:
CEMES-CNRS
J-L Putaux
Affiliation:
CERMAV-CNRS
J Thibault
Affiliation:
TECSEN-CNRS

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 894 - 895
Copyright
© 2006 Microscopy Society of America