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Analysis of Probe–Sample Interaction in Near-field Optical Image of Dielectric Structures

Published online by Cambridge University Press:  29 January 2003

S. Wang
S. Wang
Affiliation:
Centro de Ciencias de la Materia Condensada, Universidad Nacional Autónoma de México, Apartado Postal 2681, Ensenada, Baja California 22800, México
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Abstract

Abstract: A two-dimensional formalism is provided for analyzing the probe–sample interaction of optical near-field images in transmission mode. The numerical simulation is performed on a dielectric surface with sub-wavelength structures. The constant-height, near-field intensity through two Gaussian ridges has been calculated for p-polarized incident light. The influence on the signal by the dielectric function of the probe, the size of the scatterers, and the angle of incidence is investigated. The passive probe model is compared when equipped with and without the tip and the near-field intensity is simultaneously calculated.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 5 , Issue 4 , July 1999 , pp. 290 - 295
Copyright
2001 Cambridge University Press

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