Hostname: page-component-84b7d79bbc-g7rbq Total loading time: 0 Render date: 2024-08-01T18:48:52.715Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of Multiple-ion Events in Atom Probe Tomography Studies of MoNbTi and HfNbTaTiZr Refractory High Entropy Alloys

Published online by Cambridge University Press:  22 July 2022

Patrick G. Callahan ,
Keith E. Knipling  and
D. Beaudry
Patrick G. Callahan*
Affiliation:
Materials Science and Technology Division, US Naval Research Laboratory, Washington, DC, USA
Keith E. Knipling
Affiliation:
Materials Science and Technology Division, US Naval Research Laboratory, Washington, DC, USA
D. Beaudry
Affiliation:
Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD, USA
*
*Corresponding author: patrick.callahan@nrl.navy.mil

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 702 - 703
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Wang, F et al. , Science 370 (2020), p. 95. doi: 10.1126/science.aba3722CrossRefGoogle Scholar
Larson, DJ et al. in “Local Electrode Atom Probe Tomography A User's Guide”, (Springer, New York).Google Scholar
Saxey, DW, Ultramicroscopy 111 (2020), p. 473. doi: 10.1016/j.ultramic.2010.11.021CrossRefGoogle Scholar