Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-07-03T00:44:13.327Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of Defects in HgCdTe and CdTe Epilayers on Si by Dual-Beam FIB

Published online by Cambridge University Press:  31 July 2006

T Lee ,
J Huang ,
DK Cha ,
RN Jacobs ,
JH Dinan  and
MJ Kim
T Lee
Affiliation:
University of Texas at Dallas
J Huang
Affiliation:
University of Texas at Dallas
DK Cha
Affiliation:
University of Texas at Dallas
RN Jacobs
Affiliation:
U.S. ARMY
JH Dinan
Affiliation:
U.S. ARMY
MJ Kim
Affiliation:
University of Texas at Dallas

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1274 - 1275
Copyright
© 2006 Microscopy Society of America