Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
2008.
Polymer Microscopy.
p.
435.
Petrov, Yu. V.
Vyvenko, O. F.
and
Bondarenko, A. S.
2010.
Scanning helium ion microscope: Distribution of secondary electrons and ion channeling.
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques,
Vol. 4,
Issue. 5,
p.
792.
Behan, G.
Feng, J. F.
Zhang, H. Z.
Nirmalraj, P. N.
and
Boland, J. J.
2010.
Effect of sample bias on backscattered ion spectroscopy in the helium ion microscope.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 28,
Issue. 6,
p.
1377.
Scipioni, Larry
Ferranti, David C.
Smentkowski, Vincent S.
and
Potyrailo, Radislav A.
2010.
Fabrication and initial characterization of ultrahigh aspect ratio vias in gold using the helium ion microscope.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 28,
Issue. 6,
p.
C6P18.
Jun, David S.
Kutchoukov, Vladimir G.
and
Kruit, Pieter
2011.
Ion beams in SEM: An experiment towards a high brightness low energy spread electron impact gas ion source.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 29,
Issue. 6,
Petrov, Yu. V.
2012.
Scanning Helium Ion Microscope.
Nauka ta innovacii,
Vol. 8,
Issue. 2,
p.
23.
Wirtz, T
Philipp, P
Audinot, J-N
Dowsett, D
and
Eswara, S
2015.
High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy.
Nanotechnology,
Vol. 26,
Issue. 43,
p.
434001.
Petrov, Yuri V
and
Vyvenko, Oleg F
2015.
Scanning reflection ion microscopy in a helium ion microscope.
Beilstein Journal of Nanotechnology,
Vol. 6,
Issue. ,
p.
1125.
Petrov, Yu.V.
Sharov, T.V.
Baraban, A.P.
and
Vyvenko, O.F.
2015.
Effect of helium ion beam treatment on the etching rate of silicon nitride.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 349,
Issue. ,
p.
90.
Gusev, S. A.
Drozdov, M. N.
Ermolaeva, O. L.
Fraerman, A. A.
Gusev, N. S.
Mikhailovskii, V. Yu.
Petrov, Yu. V.
Sapozhnikov, M. V.
and
Vdovichev, S. N.
2016.
The modification of the structure of multilayer Co/Pt films by the irradiation with a focused helium ion beam.
Vol. 1747,
Issue. ,
p.
030002.
Kapitonov, Yu. V.
Shapochkin, P. Yu.
Beliaev, L. Yu.
Petrov, Yu. V.
Efimov, Yu. P.
Eliseev, S. A.
Lovtcius, V. A.
Petrov, V. V.
and
Ovsyankin, V. V.
2016.
Ion-beam-assisted spatial modulation of inhomogeneous broadening of a quantum well resonance: excitonic diffraction grating.
Optics Letters,
Vol. 41,
Issue. 1,
p.
104.
Petrov, Yu. V.
Sharov, T. V.
and
Baraban, A. P.
2016.
Helium ion beam enhanced local etching of silicon nitride.
Vol. 1747,
Issue. ,
p.
030004.
Belianinov, Alex
Burch, Matthew J.
Kim, Songkil
Tan, Shida
Hlawacek, Gregor
and
Ovchinnikova, Olga S.
2017.
Noble gas ion beams in materials science for future applications and devices.
MRS Bulletin,
Vol. 42,
Issue. 09,
p.
660.
Sato, Chikara
Sato, Mari
and
Ogawa, Shinichi
2018.
Imaging of immunogold labeling in cells and tissues by helium ion microscopy.
International Journal of Molecular Medicine,
Burch, Matthew J.
Ievlev, Anton V.
Mahady, Kyle
Hysmith, Holland
Rack, Philip D.
Belianinov, Alex
and
Ovchinnikova, Olga S.
2018.
Helium Ion Microscopy for Imaging and Quantifying Porosity at the Nanoscale.
Analytical Chemistry,
Vol. 90,
Issue. 2,
p.
1370.
Wang, Haitao
Xie, Wanyi
Wang, Yunjiao
Zhu, Jifeng
Liu, Mengwan
Lu, Wenqiang
Deng, Yunsheng
Wang, Guodong
and
Wang, Deqiang
2018.
Fabrication of 3D nanovolcano-shaped nanopores with helium ion microscopy.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 36,
Issue. 1,
Petrov, Yu.V.
Grigoryev, E.A.
Sharov, T.V.
and
Baraban, A.P.
2018.
Effect of helium ion beam treatment on wet etching of silicon dioxide.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 418,
Issue. ,
p.
94.
Borodinov, Nikolay
Belianinov, Alex
Chang, Dongsook
Carrillo, Jan-Michael
Burch, Matthew J.
Xu, Yuewen
Hong, Kunlun
Ievlev, Anton V.
Sumpter, Bobby G.
and
Ovchinnikova, Olga S.
2018.
Molecular reorganization in bulk bottlebrush polymers: direct observation via nanoscale imaging.
Nanoscale,
Vol. 10,
Issue. 37,
p.
18001.
Goldstein, Joseph I.
Newbury, Dale E.
Michael, Joseph R.
Ritchie, Nicholas W. M.
Scott, John Henry J.
and
Joy, David C.
2018.
Scanning Electron Microscopy and X-Ray Microanalysis.
p.
529.
Petrov, Yu. V.
Ubyivovk, E. V.
and
Baraban, A. P.
2019.
Fabrication of nanopores in silicon nitride membrane by means of wet etching enhanced by focused helium ion beam irradiation.
Vol. 2064,
Issue. ,
p.
030012.