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An Atomic Level Study of Localized Strain Fields on Multiple Low-Index Ceria (CeO2) Nanoparticle Surfaces

Published online by Cambridge University Press:  30 July 2021

Piyush Haluai ,
Ethan L. Lawrence ,
Tara Boland  and
Peter Crozier
Piyush Haluai
Affiliation:
Arizona State University, United States
Ethan L. Lawrence
Affiliation:
Arizona State University, United States
Tara Boland
Affiliation:
Arizona State University, Arizona, United States
Peter Crozier
Affiliation:
Arizona State University, Tempe, Arizona, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2918 - 2920
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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We gratefully acknowledge support of NSF grant DMR-1308085, DOE BES DE-SC0004954, the use of ASU's John M. Cowley Center for High Resolution Electron Microscopy and use of the K2 IS camera courtesy of Gatan.Google Scholar