Hostname: page-component-84b7d79bbc-g7rbq Total loading time: 0 Render date: 2024-07-25T09:04:34.708Z Has data issue: false hasContentIssue false
  • English
  • Français

An accurate Monte Carlo sampler for electron elastic scattering angular distributions between 50 eV and 300 keV

Published online by Cambridge University Press:  30 July 2021

John Villarrubia
John Villarrubia*
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1322 - 1323
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Salvat, F., Jablonski, A., and Powell, C.J., Comput. Phys. Commun 165 (2005) 157-190.Google Scholar
Salvat, F., Jablonski, A., and Powell, C.J., Comput. Phys. Commun 261 (2021) 107704.CrossRefGoogle Scholar
Jablonski, A., Salvat, F., Powell, C. J., and Lee, A. Y., NIST Electron Elastic-Scattering CrossSection Database - Version 3.2, National Institute of Standards and Technology, Gaithersburg, MD (2016); http://www.nist.gov/srd/database-64-32/, retrieved 25 Feb. 2021.Google Scholar
Villarrubia, J. et al. , Ultramicrosc. 154 (2015) 15.CrossRefGoogle Scholar