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An accurate Monte Carlo sampler for electron elastic scattering angular distributions between 50 eV and 300 keV

Published online by Cambridge University Press:  30 July 2021

John Villarrubia
John Villarrubia*
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States

Abstract

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Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1322 - 1323
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Salvat, F., Jablonski, A., and Powell, C.J., Comput. Phys. Commun 261 (2021) 107704.CrossRefGoogle Scholar
Jablonski, A., Salvat, F., Powell, C. J., and Lee, A. Y., NIST Electron Elastic-Scattering CrossSection Database - Version 3.2, National Institute of Standards and Technology, Gaithersburg, MD (2016); http://www.nist.gov/srd/database-64-32/, retrieved 25 Feb. 2021.Google Scholar
Villarrubia, J. et al. , Ultramicrosc. 154 (2015) 15.CrossRefGoogle Scholar