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An Aberration Corrected FIB for Nano-Area Mass Spectrometry

  • S Itose (a1), M Matsuya (a1), S Uno (a1), K Yamashita (a1), S Ebata (a2), M Ishihara (a2), K Uchino (a3), H Yurimoto (a4), K Sakaguchi (a1) and M Kudo (a1)...

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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An Aberration Corrected FIB for Nano-Area Mass Spectrometry

  • S Itose (a1), M Matsuya (a1), S Uno (a1), K Yamashita (a1), S Ebata (a2), M Ishihara (a2), K Uchino (a3), H Yurimoto (a4), K Sakaguchi (a1) and M Kudo (a1)...

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