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Alternative Collection Mode for Rdf Acquisition in Feg-STEM

Published online by Cambridge University Press:  02 July 2020

David C. Bell ,
Anthony J. Garratt-Reed  and
Linn W. Hobbs
David C. Bell
Affiliation:
Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, 02139
Anthony J. Garratt-Reed
Affiliation:
Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, 02139
Linn W. Hobbs
Affiliation:
Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, 02139
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Overview Radial distribution function (RDF) information obtained from amorphous glasses can provide important near and medium range structure information, determination of this information has important consequences for the encapsulation and the long term stability of nuclear waste material.

RDF data has been obtained from samples of waste glass and amorphous quartz. This data was obtained using a Vacuum Generators HB603 FEG-STEM, equipped with a GATAN Digi-PEELS. Post specimen scanning was employed to minimize the effect of spherical aberration that is present in the incident beam rocking mode.

Previous data obtained using the main-scan coils and rocking the incident beam on the specimen, diffraction information collected from out to 16 nm-1. The intensity of the information falls of rapidly as the inverse forth power of the scattering angle, out to the point where the signal to noise of the detector becomes unity. This point is limited by the sensitivity of the detector and the spherical aberration of the objective lens which limits the ultimate collection angle, regardless of the sensitivity of the detection system.

Type
Analytical Electron Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1019 - 1020
Copyright
Copyright © Microscopy Society of America 1997

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References

1. Sreeram, A. N., Qin, L. C., Garratt-Reed, A.J. and Hobbs, L. W., Proc. 54th Ann.Meeting EMSA (1996)CrossRefGoogle Scholar

2. The Center for Materials Science and Engineering is a Materials Research Science and Engineering Center sponsored by the National Science FoundationGoogle Scholar

3. This work was performed under DOE Grant DE-FG02-89ER45396Google Scholar