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Aliovalent Dopant Distribution in Nanocrystalline Tin Dioxide Thin Films Studied by XRay Energy Dispersive Spectroscopy

Published online by Cambridge University Press:  01 August 2002

J. E. Dominguez ,
H. P. Sun  and
X. Q. Pan
J. E. Dominguez
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI, 48109
H. P. Sun
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI, 48109
X. Q. Pan
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI, 48109

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1168 - 1169
Copyright
Copyright © Microscopy Society of America 2002