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AFM Transverse Shear as a Probe of Crystallinity at the Interface of Gate Insulator and Organic Semiconductor

Published online by Cambridge University Press:  23 November 2012

G. Haugstad
G. Haugstad*
Affiliation:
Characterization Facility, University of Minnesota, Minneapolis, MN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 862 - 863
Copyright
Copyright © Microscopy Society of America 2012

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