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Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

T. Sasaki ,
H. Sawada ,
F. Hosokawa ,
T. Kaneyama ,
Y. Kondo ,
K. Kimoto  and
K. Suenaga
T. Sasaki
Affiliation:
EM Technical Group 1, EM Business Unit, JEOL Ltd., Tokyo, Japan
H. Sawada
Affiliation:
EM Technical Group 1, EM Business Unit, JEOL Ltd., Tokyo, Japan
F. Hosokawa
Affiliation:
EM Technical Group 1, EM Business Unit, JEOL Ltd., Tokyo, Japan
T. Kaneyama
Affiliation:
EM Technical Group 1, EM Business Unit, JEOL Ltd., Tokyo, Japan
Y. Kondo
Affiliation:
EM Technical Group 1, EM Business Unit, JEOL Ltd., Tokyo, Japan
K. Kimoto
Affiliation:
National Institute for Materials Science (NIMS), Tsukuba, Japan
K. Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1514 - 1515
Copyright
Copyright © Microscopy Society of America 2012

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