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Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy

  • T. Sasaki (a1), H. Sawada (a1), F. Hosokawa (a1), T. Kaneyama (a1), Y. Kondo (a1), K. Kimoto (a2) and K. Suenaga (a3)...

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy

  • T. Sasaki (a1), H. Sawada (a1), F. Hosokawa (a1), T. Kaneyama (a1), Y. Kondo (a1), K. Kimoto (a2) and K. Suenaga (a3)...

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