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Advancements of Evactron® Plasma Cleaning of Moxtek® X-ray Windows

Published online by Cambridge University Press:  05 August 2019

Ewa Kosmowska ,
Michael Almond ,
Josh Wong ,
Brian Law ,
Barbara Armbruster  and
Ronald Vane
Ewa Kosmowska*
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA.
Michael Almond
Affiliation:
Moxtek Inc., Orem, UT, USA.
Josh Wong
Affiliation:
Moxtek Inc., Orem, UT, USA.
Brian Law
Affiliation:
Moxtek Inc., Orem, UT, USA.
Barbara Armbruster
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA.
Ronald Vane
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA.
*
*Corresponding author: ewa@evactron.com

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 556 - 557
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Kosmowska, E et al. , Microsc. Microanal. 23 (S1) (2017), p. 74.Google Scholar
[2]Vane, R and Moore, CA, Microsc. Microanal. 20 (S3) (2014), p. 2014.Google Scholar
[3]Kosmowska, E et al. , Microsc. Microanal. 24 (S1) (2018), p. 682.Google Scholar
[4]Vane, R et al. , Microsc. Microanal. 10 (S2) (2004), p. 966.Google Scholar