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Advanced quality control scanning system for electronic materials

Published online by Cambridge University Press:  30 July 2021

Nathaly Castaneda ,
Dhaivat J. Solanki ,
James K. Meen ,
Goran Majkic  and
Francisco C. Robles Hernandez
Nathaly Castaneda
Affiliation:
University of Houston, HOUSTON, Texas, United States
Dhaivat J. Solanki
Affiliation:
University of Houston, Houston, Texas, United States
James K. Meen
Affiliation:
University of Houston, Houston, Texas, United States
Goran Majkic
Affiliation:
University of Houston, Houston, Texas, United States
Francisco C. Robles Hernandez
Affiliation:
University of Houston, Houston, Texas, United States

Abstract

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Type
Microscopy and Microanalysis for Real World Problem Solving
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 794 - 795
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Castaneda, N., Majkic, G., and Robles, F.C., Scanning Raman spectroscopy for inline characterization of 2G-HTS conductors. Superconductor Science and Technology, 2021. 34(3): p. 035032.CrossRefGoogle Scholar
Majkic, G., et al. , Engineering of Nanorods for Superior in Field Performance of 2G-HTS Conductor Utilizing Advanced MOCVD Reactor. Ieee Transactions on Applied Superconductivity, 2017. 27(4).CrossRefGoogle Scholar