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Type
Advances in Focused Ion Beam Instrumentation and Techniques
[1]Perea, DE, Liu, J, Bartrand, J, Dicken, Q, Thevuthasan, ST, Browning, ND, Evans, JE. Scientific Reports6 (2016), p. 22321.CrossRefGoogle Scholar
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[2]Schreiber, DK, Perea, DE, Ryan, JV, Evans, JE, Vienna, JD, Ultramicroscopy194 (2018), p. 89.CrossRefGoogle Scholar
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[3]Perea, D.E., Gerstl, SSA, Chin, J, Hirschi, B, Evans, JE, Advanced Structural and Chemical Imaging3 (2017), p. 12.CrossRefGoogle Scholar
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[4]The research was performed using EMSL (grid.436923.9), a DOE Office of Science User Facility sponsored by the Office of Biological and Environmental Research.Google Scholar