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Advanced FIB-based Preparation of Cryogenically-prepared Specimens for APT Analysis

Published online by Cambridge University Press:  05 August 2019

Daniel E. Perea ,
Daniel K. Schreiber ,
Mark Wirth  and
James E. Evans
Daniel E. Perea*
Affiliation:
Earth and Biological Sciences Directorate, Pacific Northwest National Laboratory, Richland, WAUSA.
Daniel K. Schreiber
Affiliation:
Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WAUSA.
Mark Wirth
Affiliation:
Earth and Biological Sciences Directorate, Pacific Northwest National Laboratory, Richland, WAUSA.
James E. Evans
Affiliation:
Earth and Biological Sciences Directorate, Pacific Northwest National Laboratory, Richland, WAUSA.
*
*Corresponding author: daniel.perea@pnnl.gov

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 878 - 879
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Perea, DE, Liu, J, Bartrand, J, Dicken, Q, Thevuthasan, ST, Browning, ND, Evans, JE. Scientific Reports 6 (2016), p. 22321.Google Scholar
[2]Schreiber, DK, Perea, DE, Ryan, JV, Evans, JE, Vienna, JD, Ultramicroscopy 194 (2018), p. 89.Google Scholar
[3]Perea, D.E., Gerstl, SSA, Chin, J, Hirschi, B, Evans, JE, Advanced Structural and Chemical Imaging 3 (2017), p. 12.Google Scholar
[4]The research was performed using EMSL (grid.436923.9), a DOE Office of Science User Facility sponsored by the Office of Biological and Environmental Research.Google Scholar