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Z-contrast Imaging Analysis of Semiconductor Epitaxies: Application to GaNAs Quantum Wells and InAs/GaInAs/GaAs Dot in Well Structures

Published online by Cambridge University Press:  05 August 2007

M Herrera ,
QM Ramasse ,
ND Browning ,
D González ,
R Garcia  and
M Hopkinson
M Herrera
Affiliation:
University of California-Davis
QM Ramasse
Affiliation:
Lawrence Berkeley National Laboratory
ND Browning
Affiliation:
University of California-Davis
D González
Affiliation:
Universidad de Cádiz,Spain
R Garcia
Affiliation:
Universidad de Cádiz,Spain
M Hopkinson
Affiliation:
University of Sheffield,UK
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 664 - 665
Copyright
© 2007 Microscopy Society of America

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