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Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography

Published online by Cambridge University Press:  05 August 2007

M Marko ,
M Scheeff ,
N Salmon ,
C Hsieh ,
M Rodriguez ,
J Frank  and
C Mannella
M Marko
Affiliation:
Wadsworth Center
M Scheeff
Affiliation:
Hummingbid Scientific
N Salmon
Affiliation:
Hummingbid Scientific
C Hsieh
Affiliation:
Wadsworth Center
M Rodriguez
Affiliation:
University at Albany
J Frank
Affiliation:
Howard Hughes Medical Institute
C Mannella
Affiliation:
Wadsworth Center
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1460 - 1461
Copyright
© 2007 Microscopy Society of America

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