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Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Published online by Cambridge University Press:  23 November 2012

Y. Kim
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
A. Kumar
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
I. Ivanov
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
A. Tselev
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
M.D. Biegalski
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
S.V. Kalinin
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
A.Y. Borisevich
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
A. Hatt
Affiliation:
Lawrence Berkeley National Laboratory, Berkely, CA
A. Morozovska
Affiliation:
National Academy of Sciences, Kiev, Ukraine
E. Eliseev
Affiliation:
National Academy of Sciences, Kiev, Ukraine
Y. Chu
Affiliation:
National Chiao Tung University, Hsinchu, Taiwan
P. Yu
Affiliation:
University of California-Berkely, Berkely, CA
R. Ramesh
Affiliation:
University of California-Berkely, Berkely, CA
J. Rondinelli
Affiliation:
Drexel University, Philadelphia, PA

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect
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