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The Study of Ti-Mcm-41 by Transmission Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

CF. Blanford
Affiliation:
Department of Chemistry, University of Minnesota, 207 Pleasant St. S.E., Minneapolis, MN55455
B.J. Aronson
Affiliation:
Department of Chemistry, University of Minnesota, 207 Pleasant St. S.E., Minneapolis, MN55455
S. McKernan
Affiliation:
fCenter for Interfacial Engineering, University of Minnesota, 100 Union St. S.E., Minneapolis, MN55455
A. Stein
Affiliation:
Department of Chemistry, University of Minnesota, 207 Pleasant St. S.E., Minneapolis, MN55455
C.B. Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. S.E., Minneapolis, MN55455
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Extract

In 1992, researchers at Mobil Research and Development created a new class of porous silicates, most notably MCM-41. This material features a hexagonal arrangement of pores and surface areas in excess of 1000 m2 g-1. Typically, MCM-41 exhibits pore diameters around 2.5 nm and a d-spacing around 4.0 nm, but slight variations in the synthesis of MCM-41 can produce a range of pore sizes from 2 to 10 nm. Zeolites, in comparison, have pore openings smaller than 1.3 nm and surface areas of a few hundred square meters per gram.

Recently, Aronson et al. have been studying the grafting of TiO2 to MCM-41. TiO2 is a versatile photocatalyst in many selective organic oxidations and other reactions, including the degradation of environmental toxins. by dispersing TiO2 on the internal surface of a mesoporous support one can increase the active surface area significantly and introduce some size-selectivity.

Type
Analytical Electron Microscopy
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Kresge, C.T., Leonowicz, M.E., Roth, W.J., Vartuli, J.C., Beck, J.S., Nature, (1992) 710.10.1038/359710a0CrossRefGoogle Scholar
2.Beck, J.S., Vartuli, J.C., Roth, W.J., Leonowicz, M.E., Kresge, C.T., Schmitt, K.D., Chu, C.T-W., Olson, D.H., Sheppard, E.W., McCullen, S.B., Higgins, J.B., Schlenker, J.L., J. Am. Chem. Soc, (1992) 10834.10.1021/ja00053a020Google Scholar
3.Aronson, B.J., Blanford, CF., Carter, C.B., Stein, A., in preparation.Google Scholar
4.The authors acknowledge the Center for Interfacial Engineering (CIE), an NSF Engineering Research Center for financial support.Google Scholar