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Structure, Composition and Stability of Heterophase Boundaries

Published online by Cambridge University Press:  02 July 2020

M. Rühle ,
T. Wagner ,
S. Bernath ,
J. Plitzko ,
C. Scheu  and
A. Liedtke
M. Rühle
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174, Stuttgart, Germany
T. Wagner
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174, Stuttgart, Germany
S. Bernath
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174, Stuttgart, Germany
J. Plitzko
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174, Stuttgart, Germany
C. Scheu
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174, Stuttgart, Germany
A. Liedtke
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174, Stuttgart, Germany
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Extract

Heterophase boundaries play an important role in advanced materials since those materials often comprise different components. The properties of the materials depend strongly on the properties of the interface between the components. Thus, it is important to investigate the stability of the microstructure with respect to annealing at elevated temperatures. In this paper results will be presented on the structure and composition of the interfaces between Cu and (α -Al2O3. The interfaces were processed either by growing a thin Cu overlayer on α- Al2O3 in a molecular beam epitaxy (MBE) system or by diffusion bonding bulk crystals of the two constituents in an UHV chamber. To improve the adhesion of Cu to α -Al2O3 ultrathin Ti interlayers were deposited between Cu and α - Al2O3.

Interfaces were characterized by different transmission electron microscopy (TEM) techniques. Quantitative high-resolution electron microscopy (QHRTEM) allows the determination of the structure (coordinates of atoms) while analytical electron microscopy (AEM) allows the determination of the composition with high spatial resolution.

Type
Atomic Structure and Mechanisms at Interfaces in Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 673 - 674
Copyright
Copyright © Microscopy Society of America 1997

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References

1. Dehm, G., Rühle, M., Conway, H. D. and Raj, R., Acta Materialia (1997) in press.Google Scholar

2. Strecker, A., Salzberger, U. and Mayer, J., Prakt. Metallogr., 30 (1993) 481Google Scholar

3. Bernath, S., Thesis, University of Stuttgart (1997).Google Scholar

4. This work was supported by the Volkswagen Foundation.Google Scholar