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Structural Analysis for Luminous Defects on GaN Epitaxial Layers

Published online by Cambridge University Press:  03 August 2008

P Yongchoon ,
K Miyang  and
K Bae-Kyun
P Yongchoon
Affiliation:
Samsung Electro-Mechanics Co, South KOREA
K Miyang
Affiliation:
Samsung Electro-Mechanics Co, South KOREA
K Bae-Kyun
Affiliation:
Samsung Electro-Mechanics Co, South KOREA
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 396 - 397
Copyright
© 2008 Microscopy Society of America

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