Recently several different methods have been proposed to reconstruct the projected crystal potential from electron diffraction patterns. These methods envolve either diffraction patterns at many different orientations (as many orientations as beams in the pattern) and/or images, which makes their experimental realization difficult. We propose an entirely new method for reconstructing the projected crystal potential from fully dynamical [including absorption and multiple scattering effects to all orders] diffraction patterns from only a single crystal orientation and no image at all. Knowledge of the specimen thickness is not necessary. However, it requires diffraction patterns at many different accelarating voltages, which is a parameter that can easily be varied (within a certain range) in most modern electron microscopes. Since the intensities in the electron diffraction pattern are not affected by lens abberations this method is capable of reconstructing the projected potential with a resolution far better than that of any method using HRTEM images.