Article contents
Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany
Published online by Cambridge University Press: 23 November 2012
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
- Type
- Research Article
- Information
- Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 946 - 947
- Copyright
- Copyright © Microscopy Society of America 2012
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