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Quantitative Electron Holography - From The Basis of Dynamical Interaction to Holographic Materials Analysis

Published online by Cambridge University Press:  02 July 2020

Karin Brand ,
Chengshan Guo ,
Michael Lehmann  and
Hannes Lichte
Karin Brand
Affiliation:
Institute of Applied Physics, Dresden University of Technology, D 01062, Dresden, Germany
Chengshan Guo
Affiliation:
Institute of Applied Physics, Dresden University of Technology, D 01062, Dresden, Germany
Michael Lehmann
Affiliation:
Institute of Applied Physics, Dresden University of Technology, D 01062, Dresden, Germany
Hannes Lichte
Affiliation:
Institute of Applied Physics, Dresden University of Technology, D 01062, Dresden, Germany
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Abstract

Quantitative analysis of a structure means to determine which atoms are where. The where is restricted by the lateral resolution, and the which is related to the sensitivity against differences of the atomic species. Electron holography is on the move to tackle both questions.

• where - Lateral Resolution Electron holography has surmounted conventional electron microscopy in that it has reached atomic resolution both in the amplitude and phase images: with our CM30FEG/UT Special Tuebingen electron microscope, the information limit of 0.09nm and the pixel number of the 2048_ - CCD camera allow to take holograms with image details smaller than 0.095nm; the quality of correction of the aberrations allows an interpretable resolution approaching 0. lnm both in amplitude and phase [1].

• which - Phase Detection Limit (PDL) The phase detection limit describes the minimum phase difference detectable well above a given noise level.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 284 - 285
Copyright
Copyright © Microscopy Society of America 2001

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References

[1]Lehmann, Ni.Google Scholar
[2]Lichte, H., Schulze, D. and Lehmann, M., this conferenceGoogle Scholar
[3]Geiger, D.,Google Scholar