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I-V Characterization of FIB Damaged GaN Alloy LEDs

Published online by Cambridge University Press:  05 August 2007

C Progl ,
C Parish  and
P Russell
C Progl
Affiliation:
North Carolina State University
C Parish
Affiliation:
Sandia National Laboratories
P Russell
Affiliation:
North Carolina State University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1500 - 1501
Copyright
© 2007 Microscopy Society of America

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