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Evaluation of Boron Nitride Coated Nextel 312TM Fiber/BlackglasTM Composites Using an Environmental SEM

Published online by Cambridge University Press:  02 July 2020

Richard L. Schalek ,
John Helmuth  and
Lawrence T. Drzal
Richard L. Schalek
Affiliation:
Composite Materials and Structures Center, Michigan State University, East Lansing, MI, 48824
John Helmuth
Affiliation:
Composite Materials and Structures Center, Michigan State University, East Lansing, MI, 48824
Lawrence T. Drzal
Affiliation:
Composite Materials and Structures Center, Michigan State University, East Lansing, MI, 48824 Department of Chemical Engineering and Materials Science and Mechanics, Michigan State University, East Lansing, MI 48824-1226
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Extract

The most critical technical issue preventing large scale application of ceramic matrix composites is the cost-effective application of stable interface coatings on continuous ceramic fibers. Currently, an alumina-silica ceramic fiber containing up to 14 wt. % boria (Nextel 312TM) is composited at elevated temperatures to form a boron nitride (BN) coating on the fiber surface. This BN coating serves as a compliant layer facilitating crack deflection and producing a non-catastrophic failure mode. Continued development of these ceramic matrix composites requires a more complete understanding of the mechanistic paths involved in composite densification. The objective of this work is to investigate and more clearly describe the role of the BN coating and its relation to composite processing and properties of the densified Nextel 312TM fiber/BlackglasTM (silicon oxycarbide) composites.

Three composites consisting of as-received fibers (coated with an organic sizing), desized fibers (sizing removed by heating), and boron nitride coated fibers were fabricated using BlackglasTM preceramic polymer 489C B-stage resin.

Type
New Trends in Scanning Electron Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 282 - 283
Copyright
Copyright © Microscopy Society of America

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References

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