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Engineering Of Memristors For Crossbar Devices Using The Helium Ion Microscope

Published online by Cambridge University Press:  23 November 2012

D. Winston ,
D. Ohlberg ,
J. Strachan  and
R.S. Williams
D. Winston
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA
D. Ohlberg
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA
J. Strachan
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA
R.S. Williams
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 818 - 819
Copyright
Copyright © Microscopy Society of America 2012

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