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Development of a Side Entry High Tilt Cryotransfer Stage for Tomographic Applications

Published online by Cambridge University Press:  02 July 2020

B.L. Armbruster ,
R. Zolkowski  and
P.R. Swann
B.L. Armbruster
Affiliation:
Gatan, Inc., Pleasanton, California 94588 and Warrendale, Pennsylvania, 15086, USA
R. Zolkowski
Affiliation:
Gatan, Inc., Pleasanton, California 94588 and Warrendale, Pennsylvania, 15086, USA
P.R. Swann
Affiliation:
CMC, Inc., Warrendale, Pennsylvania, 15086, USA
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Extract

Three-dimensional electron microscopic imaging, or electron tomography, involves the reconstruction of individual objects from projection data collected over a large range of specimen tilts. Practical limitations of tomography are set by the range of specimen tilt available to generate projection data. In terms of tilt range, current data sets typically cover a range of up to +/-700° of tilt.

When used for applications requiring high tilt such as tomography, problems with specimen holder designs which use circular 3mm diameter grids include restricted field of view created by the standard mesh pattern of commercially available specimen grids. The standard square or hexagonally patterned support grids provide minimal area between grid bars to view a sample at high tilt. The width of the specimen clamping device and holder tip blade also limit the useable grid area to the center of the specimen when the holder is at high tilt positions.

Type
Advances in Instrumentation and Performance
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 402 - 403
Copyright
Copyright © Microscopy Society of America

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References

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