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Aberration-Corrected STEM-EELS Measurements in Fe-bearing Silicate Glasses

Published online by Cambridge University Press:  23 September 2015

K. D. Burgess ,
B. T. De Gregorio ,
M. D. Dyar ,
M. C. McCanta  and
R. M. Stroud
K. D. Burgess
Affiliation:
ASEE Postdoc, Naval Research Laboratory, Washington, DC 20375 USA (kate.burgess.ctr@nrl.navy.mil)
B. T. De Gregorio
Affiliation:
Mount Holyoke College, South Hadley, MA 01075 USA
M. D. Dyar
Affiliation:
Mount Holyoke College, South Hadley, MA 01075 USA
M. C. McCanta
Affiliation:
Naval Research Laboratory, Washington, DC 20375 USA
R. M. Stroud
Affiliation:
Naval Research Laboratory, Washington, DC 20375 USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1527 - 1528
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[7] The authors acknowledge funding from NASA SSERVI RIS4E..Google Scholar