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Aberration-corrected STEM Observations on the Interfacial Structure and Strain Fields of Patterned SrRuO3 Artificial Atoms

Published online by Cambridge University Press:  05 August 2019

H Wang ,
V Srot ,
G Laskin ,
Hans Boschker ,
J Mannhart  and
PA van Aken
H Wang*
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
V Srot
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
G Laskin
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
Hans Boschker
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
J Mannhart
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
PA van Aken
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
*
*Corresponding author: hgwang@fkf.mpg.de

Abstract

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Type
Current and Emerging Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 964 - 965
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Mannhart, J et al. , Rep. Prog. Phys. 79 (8) (2016), p. 084508.Google Scholar
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[3]Kagan, CR et al. , Science 353(6302) (2016), p. 885Google Scholar
[4]Ruzmetov, D et al. , Adv. Mater. 17(23) (2005), p. 2869.Google Scholar
[5]Laskin, G et al. , Nano Lett. (2019), in press.Google Scholar
[6]The research leading to these results has received financial support from the China Scholarship Council (No. 201504910813) and the Max Planck Society. This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No. 823717 – ESTEEM3.Google Scholar