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Aberration correction: Some Advantages and Alternatives

Published online by Cambridge University Press:  01 August 2004

R. E. Dunin-Borkowski ,
T. Kasama ,
L. Cervera ,
A. C. Twitchett ,
P. A. Midgley ,
A. C. Robins ,
D. W. Smith ,
J. J. Gronsky ,
C. M. Thomas  and
P. E. Fischione
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R. E. Dunin-Borkowski
Affiliation:
Department of Materials Science and Metallurgy, Pembroke Street, Cambridge
T. Kasama
Affiliation:
RIKEN, Saitama, Japan
L. Cervera
Affiliation:
Department of Materials Science and Metallurgy, Pembroke Street, Cambridge
A. C. Twitchett
Affiliation:
Department of Materials Science and Metallurgy, Pembroke Street, Cambridge
P. A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, Pembroke Street, Cambridge
A. C. Robins
Affiliation:
E.A. Fischione Instruments, Inc., Export, Pennsylvania
D. W. Smith
Affiliation:
E.A. Fischione Instruments, Inc., Export, Pennsylvania
J. J. Gronsky
Affiliation:
E.A. Fischione Instruments, Inc., Export, Pennsylvania
C. M. Thomas
Affiliation:
E.A. Fischione Instruments, Inc., Export, Pennsylvania
P. E. Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, Pennsylvania
C. J. D. Hetherington
Affiliation:
Department of Materials, Parks Road, Oxford, United Kingdom
A. I. Kirkland
Affiliation:
Department of Materials, Parks Road, Oxford, United Kingdom
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 22 - 23
Copyright
© 2004 Microscopy Society of America

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