Hostname: page-component-84b7d79bbc-7nlkj Total loading time: 0 Render date: 2024-07-27T17:12:12.596Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration correction in electron microscopy and spectroscopy

Published online by Cambridge University Press:  30 July 2021

Ondrej L. Krivanek
Ondrej L. Krivanek*
Affiliation:
Nion R&D, 11515 NE 118th St., Kirkland, WA 98034, USA Department of Physics, Arizona State University, Tempe, AZ 85287, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3474 - 3478
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Scherzer, O. (1936) Zeit. Phys. 101, 593.CrossRefGoogle Scholar
Scherzer, O. (1947) Optik 2, 114.Google Scholar
Zach, J. and Haider, M. (1995) Optik 99, 112.Google Scholar
Krivanek, O.L. et al. (1997) Inst. Phys. Conf. Ser. 153, 35.Google Scholar
Haider, M. et al. (1998) Nature 392, 768.CrossRefGoogle Scholar
Batson, P.E. et al. (2002) Nature 418, 617.CrossRefGoogle Scholar
Hawkes, P.W. (2015) Ultramicroscopy 156, A1.CrossRefGoogle Scholar
Krivanek, O.L. (1979) Scripta Chimica 14, 213.Google Scholar
Rose, H. (2008) Advances in Imaging and Electron Physics 153, 3.Google Scholar
Jiang, Y. et al. (2018) Nature 559, 343.CrossRefGoogle Scholar
Ibach, H. (1991) Electron Energy Loss Spectrometers, Springer.Google Scholar
Krivanek, O.L. et al. (2019) Ultramicroscopy 203, 60.CrossRefGoogle Scholar
Krivanek, O.L. et al. (2009) Phil. Trans. R. Soc. A 367, 3683.CrossRefGoogle Scholar
Krivanek, O.L. et al. (2014) Nature 514, 209.CrossRefGoogle Scholar
Miyata, T. et al. (2014) Microscopy 63, 377.CrossRefGoogle ScholarPubMed
Hachtel, J.A. et al. (2019) Science 363, 2019.Google Scholar
Hage, F.S. et al. (2020) Science 367, 1124.CrossRefGoogle Scholar
Venkatraman, K. et al. (2019) Nature Physics 15, 1237–1241.CrossRefGoogle Scholar
Idrobo, J.-C. et al. (2018) Phys. Rev. Lett. 120, 095901.Google Scholar
Lagos, M.J. and Batson, P.E. (2018) Nano Lett. 18, 4556.Google Scholar
Rez, P. et al. (2016) Nature Coms 7, article #10945.Google Scholar
Jokisaari, J.R. et al. (2018) Adv. Mater. 30, 1802702.CrossRefGoogle Scholar
Hage, F.S. et al. (2018) Sci. Adv. 4, 7495.CrossRefGoogle Scholar
Senga, R. et al. (2019) Nature 573, 247.CrossRefGoogle Scholar
Plotkin-Swing, B. et al. (2020) Ultramicroscopy 217, 113067.CrossRefGoogle Scholar
http://kavliprize.org/sites/default/files/KP2020nano_krivanek_autobiography.pdfGoogle Scholar