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4D-STEM for Quantitative Imaging of Magnetic Materials with Enhanced Contrast and Resolution

Published online by Cambridge University Press:  25 July 2016

Kayla X. Nguyen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Prafull Purohit
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA
Robert Hovden
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Emrah Turgut
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Mark W. Tate
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NYUSA
Gregory D. Fuchs
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NYUSA
Sol M. Gruner
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NYUSA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NYUSA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] Chapman, J. J. Phys. D 17, 623 (1984).Google Scholar
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[6] Supported by the NSF MRSEC program (DMR 1120296) and the Kavli Institute at Cornell.Google Scholar